Hysitron’s SEM series PicoIndenter instruments are depth-sensing nanomechanical test instruments that can be interfaced with scanning electron microscopes (SEM). With these systems, it is possible to perform quantitative nanomechanical testing while simultaneously imaging with the SEM. Coupling these two techniques allows the researcher to position the probe with extreme accuracy and image the deformation process throughout the test. These stage-mounted systems are designed for exceptional performance in the electron microscope, with vacuum compatible versions of Hysitron’s capacitive sensor technology and electrically conductive probes to prevent sample charging to maintain the highest resolution imaging during testing. The SEM series features four unique instruments that are designed to meet the in-situ mechanical testing needs of all researchers.