LM Magnification Calibration
Calibration standards are indispensable tools for calibrating microscopes and X-ray analysis systems. Only calibrated instruments produce precise data.This overview shows the available calibration standards for SEM, FIB-SEM, TEM, EDS/WDS, LM and digital imaging systems. These versatile, precise yet affordable calibration standards enable optimum calibration of your microscope.
Products
Showing 31–45 of 77 results
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Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns, unmounted
$345.63 Add to cart View Product -
Particle analysis test slide SG7 with 200 numbered particles, all glass slide
$313.78 Add to cart View Product -
Particle analysis test slide SG7 with manufacturers test type certificate
$761.25 Add to cart View Product -
Stage micrometer S1 with manufacturers comparison certificate
$803.25 Add to cart View Product -
Stage micrometer S1 with NPL traceable calibration certificate
$2,072.00 Add to cart View Product -
Stage micrometer S1 with UKAS traceable calibration certificate
$874.13 Add to cart View Product -
Stage micrometer S1, 10mm horizontal line in 0.1mm divisions, black slide/glass disc
$266.88 Add to cart View Product -
Stage micrometer S12 with manufacturers comparison certificate
$1,001.00 Add to cart View Product -
Stage micrometer S12 with NPL traceable calibration certificate
$2,270.63 Add to cart View Product -
Stage micrometer S12 with UKAS traceable calibration certificate
$1,750.88 Add to cart View Product -
Stage micrometer S12, 0.1mm horizontal line in 0.002mm divisions, black slide/glass disc
$465.50 Add to cart View Product -
Stage micrometer S16 with manufacturers comparison certificate
$913.50 Add to cart View Product -
Stage micrometer S16 with NPL traceable calibration certificate
$2,182.25 Add to cart View Product -
Stage micrometer S16 with UKAS traceable calibration certificate
$1,259.13 Add to cart View Product -
Stage micrometer S16, 1mm cross scale in 0.01mm divisions, black slide/glass disc
$378.00 Add to cart View Product