SEM / FIB Magn. Calibration
Calibration standards are indispensable tools for calibrating microscopes and X-ray analysis systems. Only calibrated instruments produce precise data.This overview shows the available calibration standards for SEM, FIB-SEM, TEM, EDS/WDS, LM and digital imaging systems. These versatile, precise yet affordable calibration standards enable optimum calibration of your microscope.
Products
Showing 46–50 of 50 results
-
Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns, mounted on 25mm Hitachi stub
$366.63 Add to cart View Product -
Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns, mounted on black microscope slide
$366.63 Add to cart View Product -
Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns, mounted on custom specimen stub
$501.38 Add to cart View Product -
Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns, mounted op 25mm JEOL stub
$366.63 Add to cart View Product -
Micro-Tec MTCD-5 Multiple target calibration standard with 4 patterns, unmounted
$345.63 Add to cart View Product