The new ƒX SEMTM custom x-ray source is designed exclusively for use on electron microscopes. The compact design, and slide mounting, allow very close coupling to the sample. The orientation yields high “flux” (x-rays) in small to large excitation areas on the sample surface. The ƒX SEMTM offers excitation areas 500µ to 25mm. The integrated high-voltage power supply operates up to a maximum power of 10 watts (35 kV and 0.1 mA depending on anode material).
The close coupling provides XRF analytical results comparable to those from traditional “benchtop” or “standalone” units. The ƒX SEMTM is designed so that it does not interfere with the normal operation of the electron microscope, including the use of the electron beam on the same sample, at the same time collecting all elements simultaneously.