ASTAR combines Precession Electron Diffraction (PED) with orientation or phase mapping allowing the characterisation of crystalline materials resulting in maps with a special resolution down to 1nm (specimen dependent).
ASTAR can turn any TEM into a very powerful analytical tool enabling orientation–phase imaging at 1 nm resolution attainable (FEG TEM) in combination with other TEM analytical techniques. In combination with TOPSPIN simultaneous orientation/phase/strain/STEM maps are possible.