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Nano TA2

September 16, 2015 by

This is the second generation from our nanoscale thermal analysis (nano-TA) family and it adds a powerful DSP controller to this technique which enables sub-100nm local thermal analysis for most commercially available AFMs. This resolution is 100x better than previously reported and is made possible by our thermal probe technology which enables you to:

  • Image the sample of interest with sub-30nm spatial resolution (in contact or intermittent contact modes) and identify the regions whose thermal properties that you’d like to study.
  • Heat a local area of less than 100nm diameter with the probe to temperatures of over 400˚C to study thermal properties such as glass transition or melting point.
  • Local heating allows very fast heating rates up to 600,000˚ C/min and eliminates thermal drift issues that plague bulk sample heating approaches.
  • Image with a heated tip to induce local thermal events over specific regions of a surface.
  • Map the temperatures across the sample with a resolution of <0.1 ºC

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Edge Scientific provides researchers and facilities with the expertise and equipment to customize their systems by integrating product lines for nanotechnology applications. Our approach is comprehensive. We assess the needs of our customers to develop complete application solutions for proposal submissions. We also employ application specialists with the expertise to ensure optimization of the systems we support.

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