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SIMS NanoSIMS 50L

October 3, 2020 by

SIMS Microprobe for Isotopic and Trace Element Analysis at High Spatial Resolution

The NanoSIMS 50L is a unique ion microprobe optimizing SIMS analysis performance at high lateral resolution. It is based on a coaxial optical design of the ion beam and the secondary ion extraction, and on an original magnetic sector mass analyzer with multicollection.

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Edge Scientific provides researchers and facilities with the expertise and equipment to customize their systems by integrating product lines for nanotechnology applications. Our approach is comprehensive. We assess the needs of our customers to develop complete application solutions for proposal submissions. We also employ application specialists with the expertise to ensure optimization of the systems we support.

Edge Scientific – Leading nanotechnology solutions.

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