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STEM

August 3, 2016 by

High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) is a very powerful technique to provide direct information on a local chemistry of nano-materials at atomic scale. Using the retrofit Deben Annular STEM, SEM users can acquire HAADF transmitted electron images for a fraction of the cost of a dedicated Transmission Electron Microscope (TEM) with HAADF detector fitted.

Twelve 3mm grids can be fitted to the STEM grid holder, allowing multiple specimen analysis. A retractable arm complete with Deben Gen5 electronics allows the STEM Detector to be used with any SEM with a suitable free chamber port and AUX video input. The 12 position grid holder is airlock compatible and is supplied complete with a stage dovetail/sledge as required.

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Edge Scientific

Edge Scientific provides researchers and facilities with the expertise and equipment to customize their systems by integrating product lines for nanotechnology applications. Our approach is comprehensive. We assess the needs of our customers to develop complete application solutions for proposal submissions. We also employ application specialists with the expertise to ensure optimization of the systems we support.

Edge Scientific – Leading nanotechnology solutions.

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