Calibration
Calibration standards are indispensable tools for calibrating microscopes and X-ray analysis systems. Only calibrated instruments produce precise data. This overview shows the available calibration standards for SEM, FIB-SEM, TEM, EDS/WDS, LM and digital imaging systems. These versatile, precise yet affordable calibration standards enable optimum calibration of your microscope.
Products
Showing 16–30 of 198 results
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Counting graticule S9, 1x1mm in 0.1mm squares, black slide/glass disc
$322.88 Add to cart View Product -
CS-20NG AFM XYZ calibration standard, 20nm Z, mounted on 12mm AFM disc
$1,163.75 Add to cart View Product -
CS-20NG AFM XYZ calibration standard, 20nm Z, unmounted
$1,163.75 Add to cart View Product -
EM-Tec Au on C resolution standard 1, 5-200nm, custom mount
$564.00 Add to cart View Product -
EM-Tec Au on C resolution standard 1, 5-200nm, mounted on Ã12.2mm JEOL stub
$279.13 Add to cart View Product -
EM-Tec Au on C resolution standard 1, 5-200nm, mounted on Ã12.7mm pin stub
$279.56 Add to cart View Product -
EM-Tec Au on C resolution standard 1, 5-200nm, mounted on Ã12.7mm Zeiss pin stub
$279.13 Add to cart View Product -
EM-Tec Au on C resolution standard 1, 5-200nm, mounted on Ã15mm Hitachi stub
$279.56 Add to cart View Product -
EM-Tec Au on C resolution standard 1, 5-200nm, unmounted
$279.13 Add to cart View Product -
EM-Tec Au on C resolution standard 2, 30-300nm, custom mount
$545.14 Add to cart View Product -
EM-Tec Au on C resolution standard 2, 30-300nm, mounted on Ã12.2mm JEOL stub
$330.75 Add to cart View Product -
EM-Tec Au on C resolution standard 2, 30-300nm, mounted on Ã12.7mm pin stub
$330.75 Add to cart View Product -
EM-Tec Au on C resolution standard 2, 30-300nm, mounted on Ã12.7mm Zeiss pin stub
$330.75 Add to cart View Product -
EM-Tec Au on C resolution standard 2, 30-300nm, mounted on Ã15mm Hitachi stub
$330.75 Add to cart View Product -
EM-Tec Au on C resolution standard 2, 30-300nm, unmounted
$318.50 Add to cart View Product