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EM-Tec LAMC-15 Large area magnification calibration standard, mounted on 25.4mm pin stub
$397.58 Add to cart View Product -
EM-Tec LAMC-15 Large area magnification calibration standard, mounted on 25mm Hitachi stub
$397.58 Add to cart View Product -
EM-Tec LAMC-15 Large area magnification calibration standard, mounted on black microscope slide
$397.58 Add to cart View Product -
EM-Tec LAMC-15 Large area magnification calibration standard, mounted on custom specimen stub
$667.43 Add to cart View Product -
EM-Tec LAMC-15 Large area magnification calibration standard, mounted op 25mm JEOL stub
$397.58 Add to cart View Product -
EM-Tec LAMC-15 Large area magnification calibration standard, unmounted
$383.63 Add to cart View Product -
EM-Tec M-1 calibration standard with 1µm grid pattern, mounted on 12.2mm JEOL stub
$182.28 Add to cart View Product -
EM-Tec M-1 calibration standard with 1µm grid pattern, mounted on 15mm Hitachi stub
$156.24 Add to cart View Product -
EM-Tec M-1 calibration standard with 1µm grid pattern, mounted on standard 12.7mm pin stub
$156.24 Add to cart View Product -
EM-Tec M-1 calibration standard with 1µm grid pattern, mounted on Zeiss 12.7mm pin stub
$156.24 Add to cart View Product -
EM-Tec M-1 calibration standard with 1µm grid pattern, unmounted
$141.36 Add to cart View Product -
EM-Tec M-1 calibration standard with 1µm grid pattern, mounted on custom stub
$342.86 Add to cart View Product
Calibration standards are indispensable tools for calibrating microscopes and X-ray analysis systems. Only calibrated instruments produce precise data.
This overview shows the available calibration standards for SEM, FIB-SEM, TEM, EDS/WDS, LM and digital imaging systems. These versatile, precise yet affordable calibration standards enable optimum calibration of your microscope.