SEM Res. Test Spec
Calibration standards are indispensable tools for calibrating microscopes and X-ray analysis systems. Only calibrated instruments produce precise data.This overview shows the available calibration standards for SEM, FIB-SEM, TEM, EDS/WDS, LM and digital imaging systems. These versatile, precise yet affordable calibration standards enable optimum calibration of your microscope.
Products
Showing 16–30 of 36 results
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EM-Tec Au on C resolution standard 3, 3-50nm, mounted on Ã12.7mm Zeiss pin stub
$612.50 Add to cart View Product -
EM-Tec Au on C resolution standard 3, 3-50nm, mounted on Ã15mm Hitachi stub
$612.50 Add to cart View Product -
EM-Tec Au on C resolution standard 3, 3-50nm, unmounted
$612.50 Add to cart View Product -
EM-Tec Au on C resolution standard 4, 2-30nm, custom mount
$896.91 Add to cart View Product -
EM-Tec Au on C resolution standard 4, 2-30nm, mounted on Ã12.2mm JEOL stub
$612.50 Add to cart View Product -
EM-Tec Au on C resolution standard 4, 2-30nm, mounted on Ã12.7mm pin stub
$612.50 Add to cart View Product -
EM-Tec Au on C resolution standard 4, 2-30nm, mounted on Ã12.7mm Zeiss pin stub
$612.50 Add to cart View Product -
EM-Tec Au on C resolution standard 4, 2-30nm, mounted on Ã15mm Hitachi stub
$612.50 Add to cart View Product -
EM-Tec Au on C resolution standard 4, 2-30nm, unmounted
$612.50 Add to cart View Product -
EM-Tec Sn on C resolution standard 6, 5nm-30um, custom mount
$911.43 Add to cart View Product -
EM-Tec Sn on C resolution standard 6, 5nm-30um, mounted on Ã12.2mm JEOL stub
$522.81 Add to cart View Product -
EM-Tec Sn on C resolution standard 6, 5nm-30um, mounted on Ã12.7mm pin stub
$522.81 Add to cart View Product -
EM-Tec Sn on C resolution standard 6, 5nm-30um, mounted on Ã12.7mm Zeiss pin stub
$522.81 Add to cart View Product -
EM-Tec Sn on C resolution standard 6, 5nm-30um, mounted on Ã15mm Hitachi stub
$522.81 Add to cart View Product -
EM-Tec Sn on C resolution standard 6, 5nm-30um,unmounted
$507.06 Add to cart View Product