EM-Tec Sn on C resolution standard 6, 5nm-30um, mounted on Ø15mm Hitachi stub


SKU: 31-022100-8 Categories: ,


EM-Tec Sn on C resolution standard 5, 5nm-30um

Tin on carbon resolution test specimen with tin spheres on carbon substrate. The tin sphere size range is 5nm – 30um. Carbon substrate size is 6mm diameter with 2mm height. Due to the large range of sphere sizes this test specimen is ideally suited for a wide range of magnifications and operating voltage. Can be used from low magnifications as low as 100x and zoom in on the smaller psheres for higher magnifications. The nearly perfect round spheres make it easy to Ideal for for resolution testing on standard SEMs. Use at 15,000x magnification or higher. Easy to use resolution specimen for standard SEMs, table top SEMs and training purposes. Excellent tool to test performance and optimize your SEM after a filament change.
Available unmounted or mounted on the most popular SEM stubs. If you work with multiple SEM platforms, look at our SEM stub adapter page. The SEM stub adapters enable you to use a single resolution standard on all SEMs.

Additional information

Weight 50 g


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