Gatan 3View system SEM pin stubs with large Ø2.4mm flat, Ø2mm pin x12.5mm H, aluminium

Description

Gatan 3View system SEM pin stubs

The Gatan3View systems use special sample pins. These are used inside SEMs to create 3D imaging data of samples by serial slicing and BSD imaging. The sample pins are offered with two sample areas:

• standard Ø1.4mm flat as sample area
• larger Ø2.4mm flat as sample area.

These pins are fully compatible with the Gatan 3View systems; Ø2mm pin, Ø3mm head with cone top and total height of 12.5mm. Manufactured from vacuum grade aluminium.

When you need a special Gatan 3view sample stub, which is not offered on our website, please contact us. We can manufacture custom sample stubs or might be able to suggest a solution with alternative sample stubs.