“Denka M3 LaB6 cathode, AEI Base, 90 degrees/15µm round tip for Zeiss EVO, LEO, Leica, CamScan, Cambridge Instruments and Philips XL-30 SEMs” has been added to your cart. View cart
EM-Tec high purity carbon Hitachi SEM sample stub, Ã25 x 6mm x M4
$8.41
SKU: 10-CC4025-1
Categories: EM-Tec high purity Carbon SEM Stubs, Hitachi M4 SEM Stubs, SEM Sample Stubs, SEM Supplies
Related products
-

Denka M3 LaB6 cathode, FEI/Philips base, 90 degrees/15µm round tip for FEI TEM/SEM and Philips EM200 TEM & PSEM 500 and later (except XL-30)
$2,371.71 Add to cart View Product -

ISI 2-Pin Filaments for ISI / ABT / Topcon SEM and ABT TEM
$1,311.96 Select options This product has multiple variants. The options may be chosen on the product page View Product -

SEM pin stub Ø50 diameter top, standard pin, aluminium
$10.29 – $51.46 Select options This product has multiple variants. The options may be chosen on the product page View Product -

SEM pin stub Ø32 diameter top, standard pin, aluminium
$15.52 – $155.17 Select options This product has multiple variants. The options may be chosen on the product page View Product
