EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si on pin stub

Description

The EM-Tec RXS-2TaSi contrast test standard includes fused Ta and Si. Mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for resolution and X-ray versus Z-contrast testing and optimizing of SEM/EDS or SEM/WDS parameters.
Reference materials: Fused Ta / Si. 200µm copper Faraday cup.