Edge Scientific
Menu
About Edge
Opportunities
News & Events
Products
Web Store
Partners
Contact
Diatome Knives
Home
/
SEM Supplies
/
SEM Sample Stubs
/
Zeiss SEM Pin Stubs
/ Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium
“EM-Tec GR20 bulk sample holder for up to Ã20mm, gilded brass, M4” has been added to your cart.
View cart
Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium
$
19.40
–
$
194.01
Package
Choose an option
5
10
50
Clear
Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium quantity
Add to cart
SKU:
N/A
Categories:
FIB low profile stubs
,
FIB Supplies
,
SEM Sample Stubs
,
SEM Supplies
,
Zeiss SEM Pin Stubs
Additional information
Additional information
Weight
N/A
Package
5, 10, 50
Related products
AEI base Filaments compatible with Zeiss EVO, LEO, Leica, and Cambridge Instrument SEMs
$
239.85
Select options
This product has multiple variants. The options may be chosen on the product page
View Product
FEI / Philips Filaments for FEI SEM/TEM and Philips PSEM 500 and later and Philips EM200 TEM and later
$
636.08
Select options
This product has multiple variants. The options may be chosen on the product page
View Product
Hitachi S-Type Filaments for S-, SU-, H- and X-Series SEM and TEM
$
1,023.36
Select options
This product has multiple variants. The options may be chosen on the product page
View Product
Tescan Filaments for Tescan SEMs and Camscan SEMs with new Tescan Columns
$
813.57
Select options
This product has multiple variants. The options may be chosen on the product page
View Product