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ASTAR combines Precession Electron Diffraction (PED) with orientation or phase mapping allowing the characterisation of crystalline materials resulting in maps with a special resolution down to 1nm (specimen dependent).
ASTAR can turn any TEM into a very powerful analytical tool enabling orientation–phase imaging at 1 nm resolution attainable (FEG TEM) in combination with other TEM analytical techniques. In combination with TOPSPIN simultaneous orientation/phase/strain/STEM maps are possible.
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TopSPIN Strain combines Precession Electron Diffraction (PED) with automated strain mapping and analysis of diffraction patterns by comparing unstrained and strained areas in the same crystalline sample (Patent Pending).
This technique gas the unique advantage of achieving high precision (0.02%) and a spatial resolution down to 3 nm (specimen dependent).
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3D diffraction tomography uses a Precession Electron Diffraction (PED) acquired tilt series of 2D off-zone patterns from a nanocrystal and transforms them into a 3D diffraction volume. Automatic clustering and manual routines are then used to determine the unit cell parameters. The extracted intensities can then be used find a structural solution, using direct methods, producing a three-dimensional atomic structure of the crystal.
DigiSTAR–precession electron diffraction (PED) device enables the collection of quasi-kinematical intensities (X-Ray like) in any TEM. PED in combination with powerful software (3D difffraction tomography) enables the reconstruction of the reciprocal cell of any nanomaterial and the automatic measurement of the reflection intensities.
In this way you can use your TEM as a powerful tool to solve any nanocrystal structure with performance comparable to the most advanced Synchrotron beamlines.
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Premium research-grade confocal Raman microscope for Advanced Research.
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The world’s smallest research-grade Raman Spectrometer.
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The world’s smallest confocal and modular Raman microscope.
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Coming soon.
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The Invizo 6000™ 3D Atom Probe microscope introduces major technology breakthroughs to push the boundaries of atom probe analysis. Its ultra wide field of view flight path and unique dual-beam deep UV laser pulse system result in higher single-specimen yield and a greater analysis volume with improved reconstruction fidelity, allowing more information to be obtained from each dataset. The Invizo 6000 is an ideal choice for advanced research on a diverse set of applications.
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The LEAP 6000 XR™ inherits key features from previous APT generations, adding deep UV laser pulsing to the proven local electrode design to deliver higher yield and data quality. Through compatibility with the microtip array and a redesigned optical system, the LEAP 6000 XR provides enhanced ease of use and the potential for fully automated operation.
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Next generation XPS, the AXIS Supra+, with enhanced performance over its predecessor, combines market leading spectroscopic and imaging capabilities with unrivalled automation to ensure high sample throughput and ease of use. Unrivalled large area spectroscopic performance allows photoelectron spectra to be acquired. Fast, high spatial resolution XPS imaging reveals the lateral distribution of surface chemistry and aids further characterization with selected area analysis.
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Multi-mode ion source for organic and inorganic sputter depth profiling
The multi-mode gas cluster ion source is designed to operate in both Arn+ cluster and Ar+ monatomic modes making it suitable for sputter cleaning and depth profiling organic, inorganic and metallic thin films. In addition it may also be used to generate low energy He+ ions for use with ion scattering spectroscopy.
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ESCApe data system encompasses instrument control, data acquisition and data processing in a single, easy to use package. With a user-friendly interface and advanced features, our software streamlines the analytical process, saving you time and maximizing efficiency. It’s the latest generation of software for use with AXIS Supra+ and AXIS Nova photoelectron spectrometers.
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Steady-State Thermoreflectance in Fiber Optics: SSTR-F
Get access to streamlined thermal conductivity measurements, from thin film to bulk, using our patented fiber-optic-based steady-state thermoreflectance tool. The automated, high throughput, turn key implementation of SSTR-F can measure the thermal conductivity of materials with values ranging from 0.05 to 500 W/m/K.
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Simplifying solid material characterization.
Enabling materials scientists and engineers to spend less time acquiring data and more time learning from it, Exum™ builds instruments and software ecosystems that combine high performance with ease-of-use.
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Available in a variety of configurations, the NexGeneration UHV Suitcase is an ultra compact, lightweight and modularly adaptable system to keep and carry your samples under true ultra-high vacuum conditions. It is delivered under vacuum, fully baked and ready to use.