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LT2830

September 17, 2015 by

The LT12830 is primarily used in SEM/FIB to enhance the accuracy and functionality of the standard microscope stage. It is an economical and technically superior alternative to laser interferometer stages.

It is built specifically for lithography, cell counting, nanoprobing, and failure analysis applications and contains two positional encoders per axis for automatic yaw error compensation.

For more information…

MM3

September 16, 2015 by

Over the last few years, the MM3A-EM micromanipulator has created an unparalleled new dimension of quality in the field of Electron Microscopy. It is employed in a wide spectrum of SEM, FIB and other microscopes for an even wider range of applications and it has become the industry standard for OEM and retrofit solutions with well over 2000 units in the field.

For more information…

VESTA

September 16, 2015 by

Anasys Instruments, the pioneers of nanoscale thermal measurements, announce the release of VESTA, the first stand-alone solution for Localized Thermal Analysis (LTA) measurements at the micron scale. This is ideal for the quality control of coatings; study of heterogeneous samples, and in-situ failure analysis applications for researchers in the polymer and pharmaceutical industries.

VestaThis Easy-to-Use instrument is designed with an integrated optical microscope for the operator to identify features of interest down to 1.5 micron in size. The operator can just click on any feature of interest in the image to perform localized thermomechanical analysis (TMA) on the features of interest using one of Anasys’ customised heated probes. VESTA enables materials characterization through the study of glass transition and melting temperatures of only the identified feature while the rest of the sample is unperturbed.

Anasys provides a variety of fabricated thermal probes of different end radius (30nm up to 5 micron) to enable optimum interrogation of sample volumes from a few cubic microns to tens of cubic nanometres or sample masses of a few micrograms down to as small as a few picograms.
This point and click technology brings a new and simple tool for scientists and technicians in academia and industry to make routine thermal analysis measurements on the micron scale. Previously, such capabilities were only available in conjunction with an expensive and complex atomic force microscope. VESTA provides a low cost solution for point thermal analysis measurements while retaining the ability to look at sample volumes on the nano scale.

For more information…

SThM

September 16, 2015 by

SThM (Scanning Thermal Microscopy):

This module (comprising controller, software and probes) enables most AFMs to be able to do temperature mapping of their sample with 0.1ºC resolution.

For more information…

afm+

September 16, 2015 by

Anasys Instruments and our scientific collaborators pioneered the field of nanoscale infrared absorption spectroscopy and imaging. Our team is focused on providing robust chemical analysis with nanometer scale spatial resolution. With a researcher’s productivity always in mind, we deliver integrated hardware and software solutions that clear the path to your next discovery. Nanoscale IR spectroscopy complemented with thermal and mechanical analysis add a special dimension to AFM imaging.

For more information…

Nano TA2

September 16, 2015 by

This is the second generation from our nanoscale thermal analysis (nano-TA) family and it adds a powerful DSP controller to this technique which enables sub-100nm local thermal analysis for most commercially available AFMs. This resolution is 100x better than previously reported and is made possible by our thermal probe technology which enables you to:

  • Image the sample of interest with sub-30nm spatial resolution (in contact or intermittent contact modes) and identify the regions whose thermal properties that you’d like to study.
  • Heat a local area of less than 100nm diameter with the probe to temperatures of over 400˚C to study thermal properties such as glass transition or melting point.
  • Local heating allows very fast heating rates up to 600,000˚ C/min and eliminates thermal drift issues that plague bulk sample heating approaches.
  • Image with a heated tip to induce local thermal events over specific regions of a surface.
  • Map the temperatures across the sample with a resolution of <0.1 ºC

For more information…

NanoIR2

September 16, 2015 by

nanoIR2TM with top side illumination

  • Expands nanoscale IR to a broad range of real world samples
  • New resonance enhanced mode enables nanoscale IR on <20nm films
  • Rich, interpretable IR spectra
  • Powerful, full featured AFM
  • Multifunctional measurements including integrated thermal and mechanical property mapping
  • Designed and built for productivity and rapid time-to-results

For more information…

Critical Point Dryer – EM CPD300

September 14, 2015 by

The drying of biological specimens such as pollen, tissue, plants, insects, as well as industrial samples, for example MEMS (Micro Electro Mechanical Systems) for SEM analysis can be prepared in the Leica EM CPD300 Critical Point Dryer, fully automatically.

To ensure a low CO2 consumption and a very short process time a new filler concept was developed. Special attention has been turned to your safety by implementing software controlled cut-off functions and integrating a waste separator.

For more information…

Coating & Freeze Fracturing Systems – EM ACE600

September 14, 2015 by

Your choice for highest resolution for TEM and FE-SEM analysis.

The Leica EM ACE600 is the perfect versatile high vacuum film deposition system designed to produce very thin, fine-grained and conductive metal and carbon coatings for highest resolution analysis, as required for your FE-SEM and TEM applications.

This high vacuum coater can be configured for the following methods: Sputtering, Carbon thread evaporation, Carbon rod evaporation, E-beam Evaporation  and Glow discharge.

The Leica EM VCT vacuum cryo transfer system adapted to the Leica EM ACE600 High Vacuum Coater is the ideal solution for contamination-free cryo SEM sample preparation.

For more information…

Sigma Family

September 11, 2015 by

Flexible Detection. 4-Step Workflow. Advanced Analytics.

Combine field emission SEM (FE-SEM) technology with advanced analytics. Profit from proven Gemini electron optics. Choose from a variety of detector options: you can image particles, surfaces, and nanostructures. Save time with the semi-automated 4-step workflow of Sigma: structure your imaging and analysis routines and increase productivity.

Sigma 300 delivers excellence in price and performance. Achieve your elemental analysis fast and convenient with the best-in-class EDS geometry of Sigma 500.

Count on accurate, reproducible results – from any sample, every time.

For more information…

GeminiSEM Family

September 11, 2015 by

Gemini Optics. Low Voltage. Variable Pressure.

The GeminiSEM family stands for effortless imaging: get sub-nanometer resolution and high detection efficiency, even in variable pressure mode. GeminiSEM 500 combines proven Gemini technology with a novel electron optical design. Achieve better resolution, especially at low voltage. With 20 times greater in-lens detection signal, you will always acquire crisp images fast and with minimum sample damage. The new variable pressure mode makes you feel like you’re working in high vacuum.

Get a flexible and reliable field emission SEM for your research, industrial lab or imaging facility. With the GeminiSEM family you always acquire excellent images from any real world sample.

For more information…

Leica Microsystems

April 20, 2015 by

Leica Microsystems is one of the market leaders in the business areas of Microscopy, Confocal Laser Microscopy with corresponding Imaging Systems, Sample Preparation and Medical Equipment. A key advantage for you, is you can configure our modular systems to suit your specific requirements. More info>>

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Edge Scientific

Edge Scientific provides researchers and facilities with the expertise and equipment to customize their systems by integrating product lines for nanotechnology applications. Our approach is comprehensive. We assess the needs of our customers to develop complete application solutions for proposal submissions. We also employ application specialists with the expertise to ensure optimization of the systems we support.

Edge Scientific – Leading nanotechnology solutions.

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