Built on our revolutionary Direct Detection Device (DDD®) sensors, our award-winning DE-series cameras are designed to deliver exceptional signal-to-noise ratio, sensitivity, and speed for demanding TEM applications from biology to materials science.
Atlas
UNPARALLELED MICRO-XRF PERFORMANCE
The Atlas™ Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (10µ) available on the market.
Additionally, the Atlas™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more. Models may be operated under air or vacuum as well as Helium flush for liquids and light element analysis.
ƒX SEMTM
The new ƒX SEMTM custom x-ray source is designed exclusively for use on electron microscopes. The compact design, and slide mounting, allow very close coupling to the sample. The orientation yields high “flux” (x-rays) in small to large excitation areas on the sample surface. The ƒX SEMTM offers excitation areas 500µ to 25mm. The integrated high-voltage power supply operates up to a maximum power of 10 watts (35 kV and 0.1 mA depending on anode material).
The close coupling provides XRF analytical results comparable to those from traditional “benchtop” or “standalone” units. The ƒX SEMTM is designed so that it does not interfere with the normal operation of the electron microscope, including the use of the electron beam on the same sample, at the same time collecting all elements simultaneously.
EBIC
The Specimen Current-EBIC Amplifier is designed to operate with the small currents absorbed by the sample in the SEM. The system gives accurate absorbed current measurements but will also provide images over a wide range of probe currents.
STEM
High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) is a very powerful technique to provide direct information on a local chemistry of nano-materials at atomic scale. Using the retrofit Deben Annular STEM, SEM users can acquire HAADF transmitted electron images for a fraction of the cost of a dedicated Transmission Electron Microscope (TEM) with HAADF detector fitted.
Twelve 3mm grids can be fitted to the STEM grid holder, allowing multiple specimen analysis. A retractable arm complete with Deben Gen5 electronics allows the STEM Detector to be used with any SEM with a suitable free chamber port and AUX video input. The 12 position grid holder is airlock compatible and is supplied complete with a stage dovetail/sledge as required.
BSE
Built on 30 years of backscattered electron detector experience the microprocessor controlled Gen5 electronics offers unrivalled speed, sensitivity and low noise.
The Deben Gen5 amplifier system can be configured with up to four BSE input channels combined with a choice of one, two or three simultaneous video output channels.
Unlike standard OEM back scattered detectors our BSE system provides an unrivalled level of adjustment permitting highly optimised images to be acquired. Matched to the latest developments in our low kV silicon detector technology, diodes are mounted on a retractable arm or in some cases directly to the objective lens.
Cathodoluminescence (CL)
Cathodoluminescence (CL)
A scintillation type Cathodoluminescence detector providing monochromatic images, with a quickly removable tip it can be converted to a Back Scattered Electron (BSE) detector giving additional function for little extra cost.
Centaurus gives excellent images at low kV – ideal for those studying fragile and beam-sensitive samples. Changing from CL to BSE is easily achieved by swapping the mirrored tip to a phosphor coated tip. A suitable free chamber port and AUX video input are required on the SEM.
View
GV10x DS Asher
The GV10x Downstream Asher’s ability to remove carbon contamination is a quantum leap beyond the traditional methods of mitigating contamination using cold trapping, nitrogen purging, and other plasma cleaners. The GV10x, with its extended power and pressure range (5 to 100 Watts and 2 to <0.005 Torr), represents a paradigm shift in the carbon decontamination of SEMs and other vacuum systems.
XRM In-Situ
In-situ testing stages provide an immediate interpretation of how the properties of materials and composites change under different loading and temperature conditions. In association with the major manufacturers of μXCT & XRM systems Deben have developed a range of tensile and cooling sub-stages to work with the most common μXCT & XRM systems.
Infrared Chamberscope GW
Deben can supply a TV chamberscope for your SEM using an internally or externally mounted high resolution camera with infra-red illumination.
The chamberscope can be mounted on any available free port, even one not directly in line with the centre of the column. There is a choice of wide angle or zoom lenses which are user interchangable.
Systems are available with or without TFT monitors and with optional USB control and image display.
Deben chamberscopes are available for all SEM makes, contact us for a quotation and to check compatibility on your SEM.
Histo
High quality diamonds guarantee perfect sections and a durable cutting edge
Easy wetting cutting edge
Optimised serial sectioning
Large boat for easy pick-up
Cyro
Thinner cryo sections
Perfect cryosections from ultrathin to semi with the same knife
Minimal compression and best structure preservation
Highest quality diamonds and optimal crystal orientation guarantee perfect ultrathin sections and a durable cutting edge
Ultra
Highest quality diamonds and optimal crystal orientation guarantee perfect ultra thin sections and a durable cutting edge
Section pick-up is facilitated as the boat is horizontal allowing the water to completely fill the boat all the way round
A hydrophilic surface makes it easy to wet the cutting edge, even with low water level
Lift-out Shuttle
In-situ lift-out techniques have become more reliable methods for preparation of samples requiring TEM and atom probe inspection. However, despite their new-found popularity, they remain considerably more expensive than ex-situ lift-out techniques and require lots of valuable time in the Focused Ion Beam (FIB). Time and cost factors call for a faster, simpler procedure without reducing the reliability of the technique.
The Lift-out Shuttle is our answer to this problem: a simple and efficient tool offering the benefits of decreased cost, increased sample throughput, reduced FIB time and reliable results.
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