The GV10x Downstream Asher’s ability to remove carbon contamination is a quantum leap beyond the traditional methods of mitigating contamination using cold trapping, nitrogen purging, and other plasma cleaners. The GV10x, with its extended power and pressure range (5 to 100 Watts and 2 to <0.005 Torr), represents a paradigm shift in the carbon decontamination of SEMs and other vacuum systems.
XRM In-Situ
In-situ testing stages provide an immediate interpretation of how the properties of materials and composites change under different loading and temperature conditions. In association with the major manufacturers of μXCT & XRM systems Deben have developed a range of tensile and cooling sub-stages to work with the most common μXCT & XRM systems.
Infrared Chamberscope GW
Deben can supply a TV chamberscope for your SEM using an internally or externally mounted high resolution camera with infra-red illumination.
The chamberscope can be mounted on any available free port, even one not directly in line with the centre of the column. There is a choice of wide angle or zoom lenses which are user interchangable.
Systems are available with or without TFT monitors and with optional USB control and image display.
Deben chamberscopes are available for all SEM makes, contact us for a quotation and to check compatibility on your SEM.
Histo
High quality diamonds guarantee perfect sections and a durable cutting edge
Easy wetting cutting edge
Optimised serial sectioning
Large boat for easy pick-up
Cyro
Thinner cryo sections
Perfect cryosections from ultrathin to semi with the same knife
Minimal compression and best structure preservation
Highest quality diamonds and optimal crystal orientation guarantee perfect ultrathin sections and a durable cutting edge
Ultra
Highest quality diamonds and optimal crystal orientation guarantee perfect ultra thin sections and a durable cutting edge
Section pick-up is facilitated as the boat is horizontal allowing the water to completely fill the boat all the way round
A hydrophilic surface makes it easy to wet the cutting edge, even with low water level
Lift-out Shuttle
In-situ lift-out techniques have become more reliable methods for preparation of samples requiring TEM and atom probe inspection. However, despite their new-found popularity, they remain considerably more expensive than ex-situ lift-out techniques and require lots of valuable time in the Focused Ion Beam (FIB). Time and cost factors call for a faster, simpler procedure without reducing the reliability of the technique.
The Lift-out Shuttle is our answer to this problem: a simple and efficient tool offering the benefits of decreased cost, increased sample throughput, reduced FIB time and reliable results.
LT2830
The LT12830 is primarily used in SEM/FIB to enhance the accuracy and functionality of the standard microscope stage. It is an economical and technically superior alternative to laser interferometer stages.
It is built specifically for lithography, cell counting, nanoprobing, and failure analysis applications and contains two positional encoders per axis for automatic yaw error compensation.
MM3
Over the last few years, the MM3A-EM micromanipulator has created an unparalleled new dimension of quality in the field of Electron Microscopy. It is employed in a wide spectrum of SEM, FIB and other microscopes for an even wider range of applications and it has become the industry standard for OEM and retrofit solutions with well over 2000 units in the field.
VESTA
Anasys Instruments, the pioneers of nanoscale thermal measurements, announce the release of VESTA, the first stand-alone solution for Localized Thermal Analysis (LTA) measurements at the micron scale. This is ideal for the quality control of coatings; study of heterogeneous samples, and in-situ failure analysis applications for researchers in the polymer and pharmaceutical industries.
VestaThis Easy-to-Use instrument is designed with an integrated optical microscope for the operator to identify features of interest down to 1.5 micron in size. The operator can just click on any feature of interest in the image to perform localized thermomechanical analysis (TMA) on the features of interest using one of Anasys’ customised heated probes. VESTA enables materials characterization through the study of glass transition and melting temperatures of only the identified feature while the rest of the sample is unperturbed.
Anasys provides a variety of fabricated thermal probes of different end radius (30nm up to 5 micron) to enable optimum interrogation of sample volumes from a few cubic microns to tens of cubic nanometres or sample masses of a few micrograms down to as small as a few picograms.
This point and click technology brings a new and simple tool for scientists and technicians in academia and industry to make routine thermal analysis measurements on the micron scale. Previously, such capabilities were only available in conjunction with an expensive and complex atomic force microscope. VESTA provides a low cost solution for point thermal analysis measurements while retaining the ability to look at sample volumes on the nano scale.
SThM
SThM (Scanning Thermal Microscopy):
This module (comprising controller, software and probes) enables most AFMs to be able to do temperature mapping of their sample with 0.1ºC resolution.
afm+
Anasys Instruments and our scientific collaborators pioneered the field of nanoscale infrared absorption spectroscopy and imaging. Our team is focused on providing robust chemical analysis with nanometer scale spatial resolution. With a researcher’s productivity always in mind, we deliver integrated hardware and software solutions that clear the path to your next discovery. Nanoscale IR spectroscopy complemented with thermal and mechanical analysis add a special dimension to AFM imaging.
Nano TA2
This is the second generation from our nanoscale thermal analysis (nano-TA) family and it adds a powerful DSP controller to this technique which enables sub-100nm local thermal analysis for most commercially available AFMs. This resolution is 100x better than previously reported and is made possible by our thermal probe technology which enables you to:
- Image the sample of interest with sub-30nm spatial resolution (in contact or intermittent contact modes) and identify the regions whose thermal properties that you’d like to study.
- Heat a local area of less than 100nm diameter with the probe to temperatures of over 400˚C to study thermal properties such as glass transition or melting point.
- Local heating allows very fast heating rates up to 600,000˚ C/min and eliminates thermal drift issues that plague bulk sample heating approaches.
- Image with a heated tip to induce local thermal events over specific regions of a surface.
- Map the temperatures across the sample with a resolution of <0.1 ºC
NanoIR2
nanoIR2TM with top side illumination
- Expands nanoscale IR to a broad range of real world samples
- New resonance enhanced mode enables nanoscale IR on <20nm films
- Rich, interpretable IR spectra
- Powerful, full featured AFM
- Multifunctional measurements including integrated thermal and mechanical property mapping
- Designed and built for productivity and rapid time-to-results
Critical Point Dryer – EM CPD300
The drying of biological specimens such as pollen, tissue, plants, insects, as well as industrial samples, for example MEMS (Micro Electro Mechanical Systems) for SEM analysis can be prepared in the Leica EM CPD300 Critical Point Dryer, fully automatically.
To ensure a low CO2 consumption and a very short process time a new filler concept was developed. Special attention has been turned to your safety by implementing software controlled cut-off functions and integrating a waste separator.
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