Y-Fi™ OPA is KMLabs’ vertically integrated, collinear optical parametric amplifier pumped by a Y-Fi HP. The class leading pulse duration of the 1035 nm centered Y-Fi HP results in both a stable, coherent white light seed source and an exceptionally high conversion efficiency into the short-wave (1250-1800 nm) and mid-wave (2.4 – 4.4 μm) infrared.
Y-Fi VUV – vacuum ultraviolet source
Probe material and molecular properties with unprecedented flexibility on ultrafast time scales
KMLabs Y-Fi™ VUV provides bright femtosecond pulses at numerous wavelengths across the vacuum ultraviolet (VUV) region, from 6.0 eV (205 nm) to 10.8 eV (115 nm). The discrete tunability of the KMLabs Y-Fi VUV vacuum ultraviolet source enables researchers to study a wide range of materials and materials properties. A simple computer-selected change of photon energy provides a powerful capability, previously only available at a synchrotron; this ability to easily change the laser wavelength can enhance many experiments. For example, in angle-resolved photoemission (ARPES) experiments, this tunability allows researchers to distinguish surface effects from bulk effects. For time-of-flight (ToF) studies of molecules, the tunability can distinguish otherwise identical isomers.
NanoLIMS
Laboratory Information Management System
Overview
NanoLIMS provides a customizable environment to manage all aspects of a laboratory facility. The goal is to model all relevant types of data that need to be documented and save / present them in a transparent and standardized way. Using proven technologies such as a relational database as a backend and a web-based frontend, data integrity and compliance with regulatory standards are ensured.
Features
- Includes all necessary hardware devices to control instrument access
- Customers (students, professors, industry customers)
- Jobs and related samples including staff notes and emails
- Result data storage under strict permission management
- Instruments (microscopes)
- Instrument users
- Instrument user training status and permissions
- Time Management (bookings and staff time)
- Supplies and Consumables
- Service Logs
- Instrument service tickets
- Billing and Invoicing
- Report generation
- Role Based Access Control
Licensing
NanoLIMS offers flexible licensing options including:
- Full support and training for staff
- Bug fixes
- New features and code maintenance
- Custom features are either included in cost of license or are priced individually depending on required code changes
- Hardware maintenance and backup of all data
Screenshots
Lyncean Compact Light Source (CLS)
* Lyncean products are no longer available.
The Lyncean Compact Light Source (CLS) is a breakthrough technology that addresses the increasing demand for access to high quality X-rays by offering the possibility of a synchrotron beamline for home laboratory applications. The Lyncean CLS X-ray beam shares some favorable features of synchrotron light – a continuously tunable energy spectrum and high spatial coherence – combined with some unique attributes such as intrinsically narrow bandwidth (few %) and a moderate (few milliradian) diverging cone beam. The highly peaked spectrum provides an extremely low-noise background compared to both conventional sources and many synchrotron beamlines.
The cone beam divergence is small enough to be efficiently focused with x-ray optics yet large enough to provide a nearly uniform area beam by letting the native beam drift several meters. The Lyncean CLS X-rays provide powerful probes to reveal a range of physical structure down to the atomic scale. The Lyncean CLS is useful across many disciplines of X-ray science, including materials, nanotechnology, structural biology, medical sciences, semiconductor metrology, pharmaceutical development, and other chemical and physical sciences. The Lyncean CLS provides scientists with access to local, on-demand synchrotron light, allowing for an unprecedented new level of productivity.
The Lyncean CLS miniature synchrotron source allows for energy and scale reduction by a factor of 200
The Lyncean CLS development builds on the U.S. investment in large synchrotrons, but with a new technology that allows the source to be very compact. Conventional synchrotron light sources employ multi-GeV electron beams that are stored in large rings of magnets to generate intense, bright, 1 Å wavelength radiation. The Lyncean CLS employs an electron beam and a high power “laser undulator” to accomplish the same effect. The shift from cm scale periodic magnets used in a typical synchrotron light source, to sub-micron period laser pulse used in the Lyncean CLS, allows a reduction of energy and scale by a factor 200 – a stadium size machine becomes a room size machine!
Enabling the future of laboratory X-ray experimentation
X-ray scientists at synchrotron laboratories around the world have developed a vast array of applications over several decades, many of which cannot be exploited using conventional sources, but can be performed by the Lyncean CLS. By opening access to these powerful x-ray applications, the Lyncean CLS enables new avenues of discovery to a broad range of researchers.
Software
To be truly effective and easy-to-use, the best instrumentation requires powerful and intuitive software for data acquisition and image processing. Besides our continual push for innovation in TEM hardware, Direct Electron also invests heavily in developing and improving software tools related to TEM imaging. Our philosophy is to deliver the latest software tools with as much flexibility as possible so you can acquire and process your data as needed to accomplish your scientific goals.
LV-Series
Our LV-Series Cameras bring the power of direct detection to low-voltage TEM applications, such as LEEM/PEEM. These cameras are a dramatic improvement over traditional detectors such as channel plates + CCD.
FC- Series
Founded upon more than two decades of experience with scientific CCDs, our fiber-coupled CCD cameras provide uncommonly high quality TEM imaging at a low cost. FC-series cameras are ideal for common TEM applications such as specimen screening, tomography, pathology, negative stain, etc. Additionally, the inherently high dynamic range of these sensors make them a great choice for diffraction, spectroscopy, and other high-intensity applications.
DE-Series
Built on our revolutionary Direct Detection Device (DDD®) sensors, our award-winning DE-series cameras are designed to deliver exceptional signal-to-noise ratio, sensitivity, and speed for demanding TEM applications from biology to materials science.
Atlas
UNPARALLELED MICRO-XRF PERFORMANCE
The Atlas™ Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (10µ) available on the market.
Additionally, the Atlas™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more. Models may be operated under air or vacuum as well as Helium flush for liquids and light element analysis.
ƒX SEMTM
The new ƒX SEMTM custom x-ray source is designed exclusively for use on electron microscopes. The compact design, and slide mounting, allow very close coupling to the sample. The orientation yields high “flux” (x-rays) in small to large excitation areas on the sample surface. The ƒX SEMTM offers excitation areas 500µ to 25mm. The integrated high-voltage power supply operates up to a maximum power of 10 watts (35 kV and 0.1 mA depending on anode material).
The close coupling provides XRF analytical results comparable to those from traditional “benchtop” or “standalone” units. The ƒX SEMTM is designed so that it does not interfere with the normal operation of the electron microscope, including the use of the electron beam on the same sample, at the same time collecting all elements simultaneously.
EBIC
The Specimen Current-EBIC Amplifier is designed to operate with the small currents absorbed by the sample in the SEM. The system gives accurate absorbed current measurements but will also provide images over a wide range of probe currents.
STEM
High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) is a very powerful technique to provide direct information on a local chemistry of nano-materials at atomic scale. Using the retrofit Deben Annular STEM, SEM users can acquire HAADF transmitted electron images for a fraction of the cost of a dedicated Transmission Electron Microscope (TEM) with HAADF detector fitted.
Twelve 3mm grids can be fitted to the STEM grid holder, allowing multiple specimen analysis. A retractable arm complete with Deben Gen5 electronics allows the STEM Detector to be used with any SEM with a suitable free chamber port and AUX video input. The 12 position grid holder is airlock compatible and is supplied complete with a stage dovetail/sledge as required.
BSE
Built on 30 years of backscattered electron detector experience the microprocessor controlled Gen5 electronics offers unrivalled speed, sensitivity and low noise.
The Deben Gen5 amplifier system can be configured with up to four BSE input channels combined with a choice of one, two or three simultaneous video output channels.
Unlike standard OEM back scattered detectors our BSE system provides an unrivalled level of adjustment permitting highly optimised images to be acquired. Matched to the latest developments in our low kV silicon detector technology, diodes are mounted on a retractable arm or in some cases directly to the objective lens.
Cathodoluminescence (CL)
Cathodoluminescence (CL)
A scintillation type Cathodoluminescence detector providing monochromatic images, with a quickly removable tip it can be converted to a Back Scattered Electron (BSE) detector giving additional function for little extra cost.
Centaurus gives excellent images at low kV – ideal for those studying fragile and beam-sensitive samples. Changing from CL to BSE is easily achieved by swapping the mirrored tip to a phosphor coated tip. A suitable free chamber port and AUX video input are required on the SEM.
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