Description
$64.45
SKU: 31-T33500-U
Categories: Calibration, Calibration, Individual Graticules, Individual Graticules, LM, LM Magnification Calibration
Description
CCS-2.5 Micro-Tec 1inch cross scale, 0.001inch div., Si/Cr, opaque
The Micro-Tec CCS-2.5 is a 1 inch cross scale with 0.001 inch divisions. 75nm thick bright chrome lines on conductive ultra-flat silicon substrate. Useful for calibration application for US or inch based products. Die size is 3.5×3.5mm. Each calibration standard has the product ID with an unique serial number etched in the standard.
Intended for reflected light microscopy, stereo microscopy, digital imaging systems and low magnification SEM applications.
Additional information
Weight | 20 g |
---|
Related products
-
TGX AFM / SPM calibration grating, 3um pitch, undercut edges, mounted on 12mm AFM disc
$467.38 Add to cart View Product -
CS-20NG AFM XYZ calibration standard, 20nm Z, mounted on 12mm AFM disc
$1,289.91 Add to cart View Product -
Stage micrometer S8, 1mm horizontal line in 0.01mm divisions, black slide/glass disc
$272.86 Add to cart View Product -
CCS-10 Micro-Tec 10mm cross scale, 0.01mm div., Si/Cr, opaque, unmounted
$233.71 Add to cart View Product